Van-der Pauw Resistivity Measurement Device

The Van-der Pauw measurement method, named after its inventor Leo J. Van der Pauw, is a widely used as a 4-point measurement for determining the sheet resistance and the Hall coefficient of materials. It can accurately measure the sample properties having any shape if the sample is 2-dimensional. It uses a four-point probe position around the perimeter of the sample rather than in a straight line.

Sample Requirements

The sample must be flat shaped and uniformly thick.
The sample should not possess isolated holes.
The sample should be isotropic and homogeneous.
The contacts should be placed at sample edges.
The contact area of individual contacts must be smaller.

Application

Determine the electrical transport properties of materials (bulk and thin films) like the electrical conductivity, the resistivity, the hall constant, the charge carrier concentration and the charge carrier mobility