Total Reflection X-Ray Fluorescence (TXRF)

Total Reflection X-Ray Fluorescence (TXRF) is an analytical technique used for the elemental analysis of various samples, particularly for trace elements. TXRF is based on the principle of total reflection, where X-rays are incident on a sample at a very shallow angle, causing total internal reflection. When X-rays interact with the sample, they excite the atoms, leading to the emission of characteristic X-rays. By measuring the energy and intensity of these emitted X-rays, TXRF can determine the elemental composition and concentration of elements in the sample. TXRF is valued for its sensitivity, non-destructive nature, and the ability to analyze small sample volumes. It finds applications in environmental analysis, semiconductor manufacturing, material science, and more, where trace element detection and quantification are essential.