Atomic Force Microscopy Analysis Solutions

Atomic Force Microscopy (AFM) provides images with near-atomic resolution to study the surface structure of solid materials including insulators. It is mainly used to measure the surface morphology, conductivity, surface potential, electric field, magnetic domain, friction, viscoelasticity, adhesion, I/V curve, modulus, dopant distribution and other surface properties of substances.

STEMart conducts atomic force microscopy analysis to measure surface topography of various materials, including polymers, ceramics, composites, glass, and biological samples.

Test Capabilities

Surface properties measurement
Hardness and modulus measurement
AFM measurements for characterizations of surface treatment effects
Surface observation
Size determination
Surface roughness measurement
Granularity analysis
Statistical processing of bumps and pits
Evaluation of film forming conditions
Measurement of the size step of the protective layer
Evaluation of flatness of interlayer insulation film
VCD coating evaluation
Evaluation of the rubbing treatment process of oriented film
Defect analysis

For more information about our atomic force microscopy analysis services, please contact us.

Online Inquiry

Holiday savings valid through 1/31/2026:

10% OFF All Testing Services
Enjoy an exclusive 10% discount on all our testing services — helping you achieve accurate results while saving costs.
(Use code: HOLIDAY10TS)

Big Savings on Product Orders
Place your orders now and unlock incredible discounts:

$50 OFF orders over $500 (Use code: HOLIDAY50)
$100 OFF orders over $1,000 (Use code: HOLIDAY100)
$500 OFF orders over $5,000 (Use code: HOLIDAY500)
$1,200 OFF orders over $10,000 (Use code: HOLIDAY1200)

All discounts applied at checkout (shipping fees not included in order total).

* The discount amount applies to a single purchase order.