Atomic Force Microscopy

Atomic force microscopy (AFM) is a very-high-resolution type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. The AFM has three major abilities: force measurement, topographic imaging, and manipulation. In force measurement, AFMs can be used to measure the mechanical properties of the sample, such as the sample's Young's modulus, a measure of stiffness. For imaging, AFMs can form an image of the three-dimensional shape (topography) of a sample surface at a high resolution. In manipulation, AFM can be used to realize atomic manipulation, scanning probe lithography and local stimulation of cells.