Proton Induced X-Ray Emission (PIXE)

Proton-Induced X-ray Emission (PIXE) is an analytical technique used for elemental analysis. It involves bombarding a sample with a beam of protons, which causes the sample to emit characteristic X-rays. By detecting and analyzing these emitted X-rays, the elements present in the sample can be identified and quantified. PIXE is particularly useful in various fields such as archaeology (for the analysis of historical artifacts), environmental science (for soil and sediment analysis), and materials science (for studying the composition of materials). This non-destructive technique provides valuable insights into the elemental composition of a wide range of samples.