Nanoparticles, defined as particles with dimensions ranging from 1 to 100 nanometers, have garnered significant attention in various fields due to their unique properties and extensive applications. However, the properties, such as electronic, optical, and mechanical properties of nanoparticles, can be significantly influenced by various structural defects that may occur during their synthesis, processing, or use.
Therefore, detecting and quantifying these structural defects is crucial for optimizing their functionality in applications ranging from drug delivery and catalysis to energy storage and nanocomposite materials. Identifying structural defects is not just important for ensuring the quality of nanoparticles but also for enhancing their efficiency and reliability in real-world applications.
STEMart focuses on the detection and characterization of structural defects in nanoparticles through advanced techniques.
HRTEM uses light and dark fringes to represent the interplanar spacing and enables researchers to observe the crystal structure and lattice defects in various nanomaterials at atomic resolution. It can be used to characterize structures such as point defects, stacking faults, dislocations, and precipitate grain boundaries.
EBSD places a fixed electron beam at a selected sampling point on the surface to offer crystallographic information, such as grain orientation, grain orientation distribution (micro-texture), and orientation relationship of the sample.
STEMart leverages state-of-the-art test methods that combine high-resolution imaging and advanced diffraction techniques, enhancing the quality and precision of defect detection. For more information about our nanoparticle structural defects detection service, please contact us.
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