Transmission Electron Microscopy Analysis

Transmission electron microscopy (TEM) is an analytical technique that uses an electron beam which is accelerated through a strong electromagnetic field to obtain high-resolution and highly detailed images to visualize the smallest structures of materials. Different from optical microscopes which rely on light in the visible spectrum, TEM is able to magnify nanometer structures up to 50 million times to reveal stunning detail at the atomic scale. TEM is an important method of material characterization and it is even possible to distinguish individual atoms and observe the microstructure of the materials.

STEMart can conduct transmission electron microscopy analysis on metals, minerals, semiconductors, superconductors and solid nanomaterials.

Test Capabilities

• Search for imperfections, failures and impurities
• Determine crystal structure of solid sample and reveal crystallographic orientations
• Observation of material microstructure
• Study the size and structure of nano-inorganic materials
• Study the size and shape characteristics of fluoropolymer particles
• Visualize the architecture of macromolecular assemblies like proteins, viruses, and intracellular structures at near atomic resolution

For more information about our transmission electron microscopy services, please contact us.