Trap Based Slow Positron Beam Spectrometer

The trap based slow positron beam spectrometer is an instrument used to study the surface of matter. It utilizes the characteristics of slow positrons to measure the change of its charge state by putting the sample into the trap, so as to obtain the electronic structure information of the material surface. The instrument has the advantages of high resolution and high sensitivity, and is widely used in the research of materials science, surface chemistry and other fields. The project is used to study metal, semiconductor and polymer thin film materials, surface defects, free volume, and pore depth.

Sample Requirements

The metal thickness is at least greater than 0.5 mm, and the side length or diameter is 2 - 5 cm.
The non-metal thickness is at least greater than 1 mm, and the side length or diameter is 2 - 5 cm.
Two copies of each sample need to be prepared.
Please contact the technical manager to confirm the test requirements before placing an order.

Application

Positron annihilation Doppler broadening measurement of surface and thin film materials
Positron 3 gamma annihilation measurement
Low energy positron physics