Structured Illumination Microscopy

Structured illumination microscopy (SIM) is a method of super-resolution microscopy which acquire multiple images of the same sample at different orientation of the structured illumination, then computationally combines these images to achieve a single reconstruction with up to 2x increase in spatial resolution over wide-field microscopy. Structure illumination microscopy (SIM) allows 4D imaging at fast frame rate, labelling using conventional fluorophores and up to 3 simultaneous color imaging.