TrueSurface Microscopy Profilometer and Imaging System, WITec GmbH (CAT#: STEM-LE-2001-LC)

TrueSurface Microscopy Profilometer and Imaging System allows confocal Raman imaging to be guided by surface topography. True Surface Microscopy can track surface topography with high accuracy, so even rough or inclined samples can always be focused. To achieve this unique feature, the WITec alpha500 series can be equipped with high-precision sensors for optical profile measurement. In the confocal Raman imaging mode, the terrain coordinates measured by the profilometer can perfectly track the sample surface. The result is an image showing the chemical properties of the sample surface, even if the surface is rough or slanted.

Type:Confocal Raman Imaging
Wavelength Range:UV-VIS-NIR
Detector(s):Optical Profilometer
Scanning Speed:2000 pixels/s
Measurement Mode(s):Confocal Raman Imaging
Spectral Bandwidth:UV-VIS-NIR
Operating Mode(s):Confocal+P6l Raman Microscopy and Imaging, Confocal Microscopy, Atomic Force Microscopy
Laser Sources:Multiple Laser Sources
Scan Time:1 to 50 ms
Focal Length:less than 1 µm
Scan Range:50 x 100 mm to 200 x 200 mm (Scan Range X/Y), 10 mm / 20 µm (Scan Range Z)
Vibration Isolation:Integrated Active Vibration Isolation System
Measures:Coarsely textured, curved or heavliy inclined sample surfaces
Max. Sample Thickness:1 to 3 mm
Vertical Resolution:40 to 120 nm

Expansion of the WITec alpha500 series, combining large-area surface topography with confocal Raman imaging and/or AFM
Easy to use through full integration with alphaControl hardware and WITec Project software environment
Scanning speed up to 2000 pixels/second
The lateral resolution is 10-25 µm and the vertical resolution is <100nm
High-brightness LED
Measuring distance: 10 mm – 16 mm
Easy to configure multi-sensor, can meet almost any application