Transmission Electron Microscope to observe fine structure (CAT#: STEM-PET-0017-WXH)

Introduction

Transmission Electron Microscope (TEM for short) can see fine structures smaller than 0.2 μm that cannot be seen clearly under an optical microscope. The principle of this technique is to project an accelerated and concentrated electron beam onto a very thin sample, and the electrons collide with atoms in the sample to change their direction, resulting in solid angle scattering. The size of the scattering angle is related to the density and thickness of the sample, so images with different brightness and darkness can be formed, and the images will be displayed on imaging devices (such as fluorescent screens, films, and photosensitive coupling components) after zooming in and focusing.