Determination of Nickel (Ni) by Proton Induced X-ray Emission (PIXE) (CAT#: STEM-EA-0152-ZJF)

Introduction

We provide the determination of Nickel (Ni) with the detection limit of 0.217 ppm by Proton Induced X-ray Emission (PIXE). We also provide the non-destructive, simultaneous analysis for 72 inorganic elements from Sodium (Na) through Uranium (U) on the Periodic Table for solid, liquid, and aerosol filter samples. Analytical capabilities and detection limits (ppm): Na-762, Mg-175, Al-68.8, Si-39.0, P-32.1, S-22.0, Cl-14.7, K-12.2, Ca-8.0, Sc-2.9, Ti-2.1, V-1.09, Cr-0.573, Mn-0.495, Fe-0.4, Co-0.319, Ni-0.217, Cu-0.408, Zn-0.55, Ga-0.574, Ge-0.659, As-0.572, Se-0.473, Br-1.34, Rb-1.87, Sr-2.18, Y-2.28, Zr-2.76, Nb-3.56, Mo-4.12, Tc-8.75, Ru-12.57, Rh-10.23, Pd-10.77, Ag-10.08, Cd-11.56, In-12.2, Sn-9.39, Sb-10.43, Te-7.49, I-7.54, Cs-7.92, Ba-5.28, La-5.45, Ce-3.78, Pr-2.97, Nd-2.47, Pm-1.62, Sm-1.54, Eu-1.54, Gd-1.16, Tb-1.1, Dy-1.21, Ho-0.751, Er-0.975, Tm-0.849, Yb-0.833, Lu-0.815, Hf-1.02, Ta-1.31, W-0.88, Re-1.68, Os-1.34, Ir-1.14, Pt-1.13, Au-1.51, Hg-2.21, Tl-1.69, Pb-1.57, Bi-1.85, Th-6.12, U-3.98. The PIXE technique offers the following advantages of analysis: • Simultaneous analysis and multi-element capability. • High sensitivity. • Non-destructive. • Measurement at atmospheric pressure available. • No time consuming digestion, minimizing the potential for error resulting from sample preparation. If you have any requirements or questions. Don't hesitate to contact us.

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Principle Applications Procedure Materials Notes Related Products

Principle

Proton Induced X-ray Emission (PIXE) is an X-ray spectrographic technique based on the emission of characteristic X-rays by the target elements following irradiation with a proton. Energetic protons (MeV level) are used to excite the inner shell electrons in the target atoms, leaving vacancies in the inner shell. X-rays are generated when the created vacancies are filled. The energies of the X-rays are uniquely characteristic of the elements from which they originate and the number of X-rays emitted is proportional to the mass of that corresponding element in the sample being analyzed. Therefore, by measuring the energies of the characteristic X-rays, the element type can be obtained, and by measuring the intensity of the X-rays, the element can be quantitatively analyzed. Since there is little overlapping of the characteristic X-rays for different elements, simultaneous detection of complicated multi-elements sample is possible.

Applications

Industrial processes, quality control, environment, geology, forensics, archeology, chemistry, biology, totally unknown samples, etc.

Procedure

1. X-ray emission: Initiate the X-ray spectrum by energetic protons exciting the inner shell electrons in the target atoms.
2. Determination: Determine the element type and elemental concentrations by measuring the energies and intensity of the characteristic X-rays.
3. Data output: Generate data report consisting a complete list of elements with "in situ" detection limit for each element, the mass fraction for those elements detected, and a statistical margin of error associated with the analysis for each elemental value provided.

Materials

• PIXE system: Accelerator, target chamber, X-ray absorber, detector, spectrum processing software, etc.
• Sample material: Solid, liquid, and thin film (aerosol filter) samples.

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