Study of Electronic structure of multiferroic BiFeO3 by X-Ray Emission Spectroscopy (XES) (CAT#: STEM-ST-0294-WXH)

Name: Study of Electronic structure of multiferroic BiFeO3 by X-Ray Emission Spectroscopy (XES)
SKU: STEM-ST-0294-WXH
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Introduction

BiFeO3 is one of the most widely studied multiferroic materials, because of its large spontaneous polarization at room temperature, as well as ferroelasticity and antiferromagnetism.
Multiferroic BiFeO3 deals with spintronic devices involved spin-charge processes and applicable in new non-volatile memory devices to store information for computing performance and the magnetic random access memories storage.

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Principle Applications Materials

Principle

XES is an element-specific method primarily used to analyze the partially occupied electronic structure of materials. The technique is one of the photon-in-photon-out spectroscopies in which an incident X-ray photon is used to excite a core electron, which leads to the transition of the electron from the ground state to the excited state, and then the excited state of the electron decays with the emission of an X-ray photon in order to fill the core hole.