Characterization of magnetic semiconductors by X-Ray Emission Spectroscopy (XES) (CAT#: STEM-ST-0288-WXH)

Name: Characterization of magnetic semiconductors by X-Ray Emission Spectroscopy (XES)
SKU: STEM-ST-0288-WXH
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Introduction

Magnetic semiconductors are semiconductor materials that exhibit both ferromagnetism (or a similar response) and useful semiconductor properties. If implemented in devices, these materials could provide a new type of control of conduction. Whereas traditional electronics are based on control of charge carriers (n- or p-type), practical magnetic semiconductors would also allow control of quantum spin state (up or down).

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Principle

XES is an element-specific method primarily used to analyze the partially occupied electronic structure of materials. The technique is one of the photon-in-photon-out spectroscopies in which an incident X-ray photon is used to excite a core electron, which leads to the transition of the electron from the ground state to the excited state, and then the excited state of the electron decays with the emission of an X-ray photon in order to fill the core hole.