OmniScan iX UT Flaw Detector, Olympus NDT (CAT#: STEM-LE-0763-LC)

OmniScan iX UT Flaw Detector is specially designed for high-speed testing of key industrial components and aerospace manufacturing, automotive industry, welding components, integrated inspection systems, and complies with GE DFO P3TF22, P3TF30, P3TF31 and P3TF35 guidelines.

Measurement Mode(s):A-Scan, B-Scan, C-Scan, Strip Charts, Multiple A-Scans and TOFD
Dimensions:(WxDxH) 14.75 x 7.3 x 9.4 in (benchtop version) or 19 x 7.5 x 8.7 in (rack mount version)
Weight:14.3 lbs
Test Mode(s):Pulse Echo, Pitch Catch or Through Transmission
Compliance:GE DFO P3TF22, P3TF30, P3TF31 and P3TF35
Gain:0 to 110 dB
Data Storage:A-scan: 6000 A-scans/sec; C-scan: 10,000 (A1, A2, A3, T1, T2, T3)

Data storage capability (internal and external)
Strip chart display
16 real-time alarms
16 real-time analog outputs (at PRF)
4 digital inputs
Remote control from PC
Multiple A-scans
A-scan and C-scan imaging
19-in., 5U rack-mount version
TomoView™-compatible for data analysis only
Remote control functions, for custom programming
2-axis mechanical encoders
Multiple scan modes, including helicoidal
Multiple channels (up to 8)
TCG/DAC curves
Interface gate for immersion testing
Touch screen
VGA output
Maximum PRF is equal to the PRF divided by the number of channels (up to 12 kHz)
USB ports for keyboard, mouse, printer, and external storage
Back-wall echo attenuator (available at the end of 2006)

EPOCH 1000 Series Flaw Detector, OmniScan MX Flaw Detector, OmniScan MX2 Flaw Detector