NEX DE Variable spot size EDXRF Spectrometer, Rigaku (CAT#: STEM-LE-1094-LC)

NEX DE Variable spot size EDXRF Spectrometer provides extensive element coverage through the easy-to-learn Windows-based QuantEZ software. Non-destructive analysis from sodium (Na) to uranium (U) in almost all matrices, from solids and alloys to powders, liquids and slurries.

Element Range:11Na to 92U
Sample Type:Solids, Liquids, Alloys, Powders and Thin Films
X-Ray Tube:60 kV X-ray Tube (max. 12 W)
Detector(s):High performance FAST SDD detector, Peltier thermo-electric cooling

1, 3 and 10 mm spot size, software optional
High-resolution imaging can accurately locate the sample
Powerful Windows-based QuantEZ software
60kV X-ray tube with wide element coverage
FASTSDD® detector provides excellent counting statistics
Multiple automatic tube filters increase sensitivity
Unbeatable price-performance ratio
Optional RPF-SQX basic parameter software
Optional software without standard basic parameters

NEX DE FAST SDD® EDXRF Spectrometer, NEX QC Energy Dispersive X-ray Fluorescence Analyzer, NEX QC+ EDXRF Spectrometer, NEX QC+ QuantEZ Benchtop EDXRF Spectrometer