X-Ray Fluorescence Spectroscopy (XFS) Technology

X-ray fluorescence spectroscopy (XFS) is a technology for the analysis of element composition and content by using element characteristic X-ray spectrum. The X-ray signature (fluorescence) spectral line excited from each element has its characteristic wavelength value, and its peak intensity is related to the amount of the element in the material. X-ray fluorescence spectroscopy has the characteristics of fast analysis speed, wide measurement range and small interference. The technology has a wide range of applications, suitable for metallurgy, geology, non-ferrous metals, building materials, environmental protection, health and other fields, which can analyze solid, powder, beads, liquid and other samples.