High-quality products
Reliable performance
Nanometer resolution over a 50 mm area
Combines the capabilities of an optical microscope, surface profiler, and SEM
Non-contact measurements on any material type
Cat Number: STEM-LE-0116-LC
Application: Transportation and Metal imaging, Precision processing and Chemical analysis, Semiconductor and Electronic component analysis
Model: VK-X1000
High-quality products
Reliable performance
Wide range of applications
For various laboratory needs
Expert support
Professional service team
Fast delivery
Global shipping