Total-Reflection XRF Spectrometer TX3300, 20 ppb-100 ppm (CAT#: STEM-AL-9782-ZJF)

The TX3300 is designed for trace multi-element analysis by total-reflection X-ray fluorescence. It uses total-reflection X-ray fluorescence to reduce spectral background during trace-element measurement. The stated configuration is distinguished by 20 ppb-100 ppm. The design supports small-volume or online sample handling according to the stated configuration. Its measurement hardware follows the detector, excitation, optical, or sampling configuration stated for this product. The system provides trace-element acquisition with SDD detection and digital result processing. The listed operating limits define the applicable sample, environment, or throughput envelope for this configuration. Overall, it provides a dedicated analytical platform for trace multi-element analysis by total-reflection X-ray fluorescence.

Product Type: Total-Reflection XRF Spectrometer
Model: TX3300
Technology: TXRF
Element Range: Mg-U
Concentration Range: 20 ppb-100 ppm
Sample Types: Liquid, Suspension, Powder, Particle, Metal
Liquid Sample Volume: 1-50 µL
Maximum Particle Diameter: 100 µm
Maximum Powder Mass: 10 µg
Detector: Large-Area SDD
Display: 8-Inch Capacitive Touchscreen

Total-Reflection XRF
Low-Background Trace Analysis
SDD Detection
Small-Sample Measurement
Digital Data Processing
Multi-Element Analysis