PPP Magnetic Force Microscopy AFM Probes, Park Systems Inc (CAT#: STEM-LE-0864-LC)

The NANOSENSORS™ PPP Magnetic Force Microscopy AFM Probe is our standard probe for magnetic force microscopes, with reasonable sensitivity, resolution and coercivity. It has been proven that it can stably record various recording media and other samples. The force constant of this probe type is specially tailored for the magnetic force microscope, which can produce high force sensitivity, and can realize both tapping mode and lifting mode operation. The hard magnetic coating on the tip is optimized to achieve high magnetic contrast and high lateral resolution well above 50 nm.

Material:Magnetic Coated
Resonant Frequency:75 kHz
Force Constant:2.8 N/m
Tip Measurement:2.0 to 4.0 µm
Cantilever Length:215 to 235 µm