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NANOHUNTER II Benchtop Total XRF Spectrometer, Rigaku (CAT#: STEM-LE-1095-LC)
Highlights
Benchtop TXRF for ultra-trace analysis
GI-XRF capability for thin film characterization
Quantify to parts-per-billion (ppb) levels
Description
The NANOHUNTER II Benchtop Total XRF Spectrometer can perform highly sensitive ultra-trace element analysis on liquids as low as parts-per-billion (ppb) concentrations.
Specification
Principle:Energy Dispersive X-ray Fluorescence
X-Ray Tube:600 W
Detector(s):SDD (Peltier thermo-electric cooling)
Element Range:Na to U
Sample Chamber:26 x 76 mm, max. 5 mm thickness
X-Ray Tube:600 W
Detector(s):SDD (Peltier thermo-electric cooling)
Element Range:Na to U
Sample Chamber:26 x 76 mm, max. 5 mm thickness
Features
Benchtop TXRF for ultra-trace analysis
GI-XRF capability for thin film characterization
Quantify to parts-per-billion (ppb) levels
600 W X-ray tube for fast measurements
Silicon drift detector (SDD)
16 position autosampler
High sensitivity for As, Se and Cd
Perfect for nano-particle analysis
GI-XRF capability for thin film characterization
Quantify to parts-per-billion (ppb) levels
600 W X-ray tube for fast measurements
Silicon drift detector (SDD)
16 position autosampler
High sensitivity for As, Se and Cd
Perfect for nano-particle analysis
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Wide range of applications
For various laboratory needs
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