General-Purpose XRF Spectrometer ScopeX CS, F-U Element Range (CAT#: STEM-AL-9776-ZJF)

The ScopeX CS is designed for laboratory elemental analysis of solids, powders, films, and other materials. It uses X-ray fluorescence measurement for nondestructive elemental characterization. The stated configuration is distinguished by F-U element range. The design supports portable or benchtop sample handling according to the configuration stated for the product. Its measurement hardware follows the detector, excitation, optical, or sampling configuration stated for this product. The system provides direct spectral measurement with digital data processing and model-specific user controls. The listed operating limits define the applicable sample, environment, or throughput envelope for this configuration. Overall, it provides a dedicated analytical platform for laboratory elemental analysis of solids, powders, films, and other materials.

Product Type: Benchtop General-Purpose XRF Spectrometer
Model: ScopeX CS
Element Range: F-U
Sample Chamber: 304 × 368 × 78 mm
Sample Weight: 0-2.5 kg
Main Unit: 570 × 400 × 400 mm
Main Unit Weight: 64 kg
X-Ray Generator: 50 W Side-Window Tube
Voltage: Up To 50 kV
Current: Up To 1 mA
Detector: Large-Area SDD
Sampling: Manual Or Automatic

XRF Elemental Analysis
Nondestructive Measurement
Model-Specific Detector Configuration
Digital Data Processing
Rapid Sample Screening
Configurable Measurement Workflow