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Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) Technology

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) technology excites the surface of a sample with primary ions to generate extremely small amounts of secondary ions. The mass of the secondary ion is determined according to the different time it takes the secondary ion to travel to the detector for different masses. This technology has excellent detection sensitivity and depth discrimination rate, and is often used in the depth analysis of dopants and impurities, the composition and impurity determination of thin films, and the overall analysis of silicon materials.

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Spectroscopy Technology

Secondary Ion Mass Spectrometry (SIMS) Technology

Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) Technology

CAT#: STEM-ST-1787-CJ

Service Name: Analysis of Kerogens and Model Compounds by Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)

CAT#: STEM-ST-1788-CJ

Service Name: Assessment of Organic Coatings by Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)

CAT#: STEM-ST-1789-CJ

Service Name: Analysis of Langmuir-Blodgett Overlayers by Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)

CAT#: STEM-ST-1790-CJ

Service Name: Analysis of Polymer Surfaces and Additives by Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)

CAT#: STEM-ST-1791-CJ

Service Name: Analysis of the Hydrogen and Impurity Contents of Amorphous Silicon by Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)

CAT#: STEM-ST-1792-CJ

Service Name: Characterization of Purified Biomarker Compounds by Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)

CAT#: STEM-ST-1793-CJ

Service Name: Analysis of Adsorbed Proteins by Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)

CAT#: STEM-ST-1794-CJ

Service Name: Analysis the Nature of Historical Tapestries by Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)

CAT#: STEM-ST-1795-CJ

Service Name: Characterization of the Covalent Bonding between Carbon Surface and Aryl Groups by Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)

CAT#: STEM-ST-1796-CJ

Service Name: Quantitative Analysis of Binary Adsorbed Protein Films by Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)

CAT#: STEM-ST-1797-CJ

Service Name: Analysis of Archaeal Core Ether Lipids by Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)

CAT#: STEM-ST-1798-CJ

Service Name: Imaging of Crystalline and Amorphous Surface Regions by Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)

CAT#: STEM-ST-1799-CJ

Service Name: Characterization of Polysiloxanes by Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)

CAT#: STEM-ST-1800-CJ

Service Name: Analysis of Diverse Asphaltenes by Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)

CAT#: STEM-ST-1801-CJ

Service Name: Characterization of Sequentially Grafted Polysaccharide Coatings by Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)

CAT#: STEM-ST-1802-CJ

Service Name: Analysis of Ink/Coating Penetration on Paper Surfaces by Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)

CAT#: STEM-ST-1803-CJ

Service Name: Characterisation of the Bound Lipids at the Wool Fibre Surface by Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)

CAT#: STEM-ST-1804-CJ

Service Name: Surface Analysis of the Size-Fractioned Urban Aerosols by Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)

CAT#: STEM-ST-1805-CJ

Service Name: Quantitative Surface Analysis of Styrene–Butadiene Copolymers by Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)

CAT#: STEM-ST-1806-CJ

Service Name: Characterization of Poly(dimethylsiloxane)s by Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)

CAT#: STEM-ST-1807-CJ

Service Name: Characterization of Adhesive and Coating Constituents by Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)