TFA Thin Film Analyzer, Linseis Inc (CAT#: STEM-LE-0254-LC)

The TFA Thin Film Analyzer is ideal for characterization of various thin film samples in an ultra comfortable and rapid way. It is an easy-to-operate, stand-alone system that uses the patent-pending measurement design to provide the highest quality results.

Temperature Range: [RT + 5 °C] up to 200°C
Principle: Chip based (pre-structured measurement chips)

High quality, easy-to-operate characterization system for thin films (nm to µm range).
Temperature dependent measurements (-170 to +200°C – optional 300°C).
It is easy to prepare and process sample.
Chip based measurement device with pre structered chips as consumeables.
High measurement flexibility (sample thickness, sample resistivity, deposition methods).
A wide range of physical properties are taken from same sample in single run.
Ability of measuring samples with metallic behavior as well as ceramics or organics.

Heat Flow Meter - Thermal Conductivity Testing, L79/ HCS Hall Effect Analysis / Hall Constant Measurement, LZT-Meter (combined LSR/LFA), Transient Hot Bridge (THB) Thermal Conductivity Meter