Study of root surface following mini-implant anchorage for maxillary incisors intrusion by scanning electron microscope technology (CAT#: STEM-MIT-0088-LJX)

Scanning electron microscope (SEM) is another tool to study the surface morphology, which is different from transmission electron microscope and optical microscope. SEM uses extremely narrow electron beams to scan the sample and uses point-by-point imaging to obtain an enlarged image. SEM generates secondary electron emission through the interaction between the electron beam and the sample, and the secondary electron can produce the morphologic image of the sample surface enlargement. SEM can directly utilize the material properties of the sample surface for microscopic imaging.
SEM provides the possibility to study the relationship between the three-dimensional structure of cell or tissue surface and antigen composition. The markers used in scanning electron microscopy should be able to be in the range of scanning electron microscopy, and have good localization ability to cell or tissue antigen. The selection of markers should be based on the purpose of the study. If the volume of the marker cells is large, large markers should be used, while small, easily identifiable markers should be selected to locate the receptor.

Imaging and analysis in the fields of biology, medicine, materials and chemistry

1. Sampling
2. Preparation of slices
3. Staining (Select according to the specific experimental situation)
4. Observation

• Sample Type:
Maxillary incisors

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