Predicting the chemical composition and structure of Aspergillus nidulans hyphal wall surface by atomic force microscopy (CAT#: STEM-SMMT-0022-LJX)

Atomic force microscope (AFM) is a new type of surface analysis instrument based on the principles of physics and imaging through the interaction of scanning probe and sample surface atoms. It belongs to the third generation of microscopes after optical microscopes and electron microscopes.
AFM usually uses a sharp probe to scan the sample, which is fixed on a microcantilever that is extremely sensitive to the surface force between the probe and the sample. The deflection of the cantilever under force can cause the laser beam emitted by the laser source to shift after being reflected by the cantilever. The detector receives reflected light, and finally receives signals that are collected, processed, and formed into surface morphology images of the sample through a computer system.

Imaging of micro and nanoscale features on the surface of the sample
Suitable for research in fields such as materials science, biology, and chemistry

1. Sampling
2. Preparation of slices
3. Staining (Select according to the specific experimental situation)
4. Observation

• Sample Type:
Aspergillus nestularis

Operate in strict accordance with the operating procedures, and shall not arbitrarily change the operating procedures