PointProbe Plus (PPP) Non-Contact AFM Probes, Park Systems Inc (CAT#: STEM-LE-0865-LC)

The new PointProbe®Plus (PPP) combines the well-known functions of the proven PointProbe® series, such as a high degree of application versatility and compatibility with most commercial SPMs, with a further reduced and reproducible tip radius and more clear tip shape. The typical tip radius is less than 7 nm, and the tip shape changes minimally, providing more reproducible images and higher resolution.

Type:Non-Contact AFM
Material:Aluminum Coated
Resonant Frequency:190 to 330 kHz
Force Constant:42 to 48 N/m
Tip Measurement:3 to 5 µm or 6 to 8 µm
Cantilever Length:115 to 135 µm or 215 to 235 µm

Ensure that the radius of curvature of the tip is <10 nm
Highly doped to eliminate static charge
High mechanical Q factor enables high sensitivity

SuperSharpSilicon (SSS) Non-Contact AFM Probes