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General Purpose AFM Probes, HQ:NSC14/Cr-Au BS, 160 kHz (5 N/m), MikroMasch (CAT#: STEM-M-0081-LKN)
Cat Number: STEM-M-0081-LKN
Application: Cantilevers of the 14 series are generally used in tapping mode for imaging relatively soft samples to obtain better phase contrast and reduce surface deformations caused by tip tapping. Probes with coatings can also be used in conductive AFM techniques.
Model: HQ:NSC14/Cr-Au BS
Description
MikroMasch General Purpose AFM Probes are suitable for most of the routine topography imaging experiments. Using these probes, lateral resolution down to 5 nm is attainable for scan size below 1 μm. Usually, sharpened silicon etched probes are used for general purpose measurements.
Specification
Typical radius of uncoated tip: 8 nm
Full tip cone angle: 40°
Total tip height: 12 - 18 µm
Probe material: n-type silicon
Probe bulk resistivity: 0.01 - 0.025 Ohm*cm
Detector coating: Gold
Full tip cone angle: 40°
Total tip height: 12 - 18 µm
Probe material: n-type silicon
Probe bulk resistivity: 0.01 - 0.025 Ohm*cm
Detector coating: Gold
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Conductive AFM Probes, HQ:NSC14/Cr-Au, 160 kHz (5 N/m), MikroMasch (CAT#: STEM-M-0083-LKN)
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