EDX-LE Energy Dispersive X-ray Fluorescence Spectrometer, Shimadzu (CAT#: STEM-LE-1188-LC)

EDX-LE Energy Dispersive X-ray Fluorescence Spectrometer is specifically designed to screen elements regulated by the RoHS/ELV directive. Its Si-PIN semiconductor detector does not require liquid nitrogen, which reduces operating costs and simplifies maintenance. The automatic analysis function improves operability without compromising its high level of inspection reliability.

Detector(s):Si-PIN Semiconductor Detector
Principle:Energy Dispersive X-ray fluorescence
Sample Type:Solids, Liquids or Powder
X-Ray Tube:Rh target, 5 to 50 kV and 1 to 1000 uA
Element Range:13Al to 92U
Sample Chamber:(WxDxH) up to 370 x 320 x 155 mm
Analysis Diameter:3, 5 and 10 mm (Automatic switching )

Exceptional labor savings, high-speed screening
Easily carry out difficult tasks
All necessary functions are provided

EDX-7000/8000 Energy Dispersive X-ray Fluorescence Spectrometers