Desktop Scanning Electron Microscope SuperSEM N10, ≥250000× (CAT#: STEM-AL-9831-ZJF)

The SuperSEM N10 is designed for desktop electron microscopy and elemental microanalysis. It uses scanning electron microscopy for high-magnification surface imaging, with EDS capability where listed. The stated configuration is distinguished by ≥250000× magnification. The design supports microstructural imaging of samples within the stated chamber and stage-travel limits. Its measurement hardware follows the detector, excitation, optical, or sampling configuration stated for this product. The system provides electron-beam scanning with detector-based imaging and optional or integrated elemental analysis. The listed operating limits define the applicable sample, environment, or throughput envelope for this configuration. Overall, it provides a dedicated analytical platform for desktop electron microscopy and elemental microanalysis.

Product Type: Desktop Scanning Electron Microscope
Model: SuperSEM N10
Variants: N10, N10eX, N10eV
Dimensions: 292 × 570 × 515 mm
Weight: 55-57 kg By Variant
Accelerating Voltage: 0-15 kV Or 0-30 kV By Variant
Stage Travel: X 50 mm, Y 50 mm, Z 30 mm
Maximum Sample Diameter: 90 mm
Maximum Magnification: ≥250000×
Electron Gun: Pre-Aligned Tungsten Filament
Detectors: BSE, Optional/Variant SE And EDS

Scanning Electron Microscopy
High-Magnification Imaging
Automated Sample Stage
Backscattered-Electron Detection
EDS Elemental Analysis
Desktop Instrument Format