CRYSTAF Instrument, Polymer Characterization, S.A., (CAT#: STEM-LE-0936-LC)

Highlights

CRYSTAF technology of automatic measurement CCD
Five samples were analyzed within 8 hours.
Can be converted to CRYSTAF-TREF instrument.

Cat Number: STEM-LE-0936-LC

Application: Chemical Composition Distribution (CCD) in Polyolefins

Add to Cart

Description Specification Features Related Products

Description

The CRYSTAF instrument uses Crystallization Analysis Fractionation technique to separate polymers by their comonomer content. The process is completed on a single temperature ramp, while using the polymer carbon infrared detector IR4 to monitor the concentration of the polymer solution.

Specification

Type:Crystallization Analysis Fractionation
Detector(s):Infrared Detector IR4

Features

CRYSTAF technology of automatic measurement CCD
Five samples were analyzed within 8 hours.
Can be converted to CRYSTAF-TREF instrument.
For low crystallinity samples, works in an environment below -20 °C.

Related Products

CRYSTEX® 42 Instrument, CRYSTEX® QC Instrument, TGIC Instrument, TREF Instrument

Other recommended products

Plasma Profiling TOFMS, With Depth Profiling Technique, HORIBA Scientific (CAT#: STEM-CA-0013-LKN)
TOPwave Sample Preparation System, 480 x 640 x 440 mm, Analytik Jena (CAT#: STEM-LE-1565-Y)
CFC, Polymer Characterization, S.A., (CAT#: STEM-LE-0941-LC)
LAB-X5000 Benchtop EDXRF Analyzer, Element Range: Na-U, Hitachi High-Tech Analytical Science America, Inc (CAT#: STEM-CA-0004-LKN)
FOUNDRY-MASTER Smart Benchtop OES Analyzer, Wires, Small parts, Curved Surfaces, Hitachi High-Tech Analytical Science America, Inc (CAT#: STEM-CA-0009-LKN)
Fully Automatic Chemistry Analyzer NFAC-202, LABNICS EQUIPMENT LTD. (CAT#: STEM-AIAE-0055-LC)
Fully Automatic Chemistry Analyzer NFAC-203, LABNICS EQUIPMENT LTD. (CAT#: STEM-AIAE-0056-LC)
GD-Profiler 2 Glow Discharge Spectrometer, Wavelength Range: 110 to 800 nm, HORIBA Scientific (CAT#: STEM-CA-0014-LKN)