BK-R670 Automatic Refractometer 1.30000-1.70000 nD Refractive Index, 0-100% Brix (CAT#: STEM-LT-0962-ZJF)

The BK-R670 Automatic Refractometer features a high-performance CCD light-sensitive component that enables accurate and efficient sample analysis. Utilizing advanced signal acquisition, analysis, and processing technology, it offers precise measurement of refractive index (1.30000-1.70000 nD) and Brix (0-100%). The device includes a Peltier temperature controller for stable temperature regulation and displays results on a 7-inch TFT LCD touch screen. It also supports data storage with a 4GB capacity and provides multiple interface options, making it ideal for laboratory environments requiring high precision and reliability.

Refractive Index Measuring Range: 1.30000-1.70000 nD
Measuring Error: ±0.0001 nD
Measuring Resolution: 0.0001/0.00001 (Optional)
Brix Measuring Range: 0-100%
Measuring Error (Brix): ±0.1%
Measuring Resolution (Brix): 0.1%/0.01% (Optional)
Temperature Control Mode: Peltier temperature controller
Temperature Display Range: 0-100°C
Temperature Control Range: 5-80°C
Temperature Control Accuracy: ±0.02°C
Interface: RS232, USB, Ethernet interface
Data Storage Capacity: 4GB
Display: 7’’ TFT LCD touch screen
Power Consumption: 45W
Power Supply: AC110V/220V±10%, 50/60Hz
External Size (W x D x H): 365 x 300 x 150 mm
Packing Size (W x D x H): 490 x 420 x 300 mm
Gross Weight: 8 kg

Cloud service system connects the cloud database with instruments for seamless data access.
7” LCD touch screen with an innovative Windows software interface for easy operation.
Multiple connectivity options: 2 USB ports, RS232, internet port for printer or network connection, plus U disk and SD card ports for data export.
Precision measuring prism made of high-hardness sapphire glass, resistant to corrosion and scratches, ensuring durability and easy cleaning.
Ultra-long life light source with high-brightness LED, lasting over 100,000 hours.
Peltier-based auto temperature control system ensures consistent accuracy and stable temperature during testing.

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