ARCOS ICP-OES Spectrometer, SPECTRO Analytical Instruments (CAT#: STEM-LE-1288-LC)

ARCOS ICP-OES Spectrometer can perform the most advanced elemental analysis of metals, chemicals, petrochemicals and other materials. Its unique MultiView plasma interface option offers uncompromising axial and radial plasma observation in one instrument. The periscope-less MultiView mechanism allows the operator to truly "transform" the "radial view" instrument into an axial view device in 90 seconds or less, and vice versa.

Wavelength Range:130 ( or 160 ) to 770 nm
Resolution:130 ( or 160) to 340 nm, 8.5 pm / 3 pm; Greater than 340 nm, 16 pm / 6 pm
Optical System:Optimized Rowland Circle Alignment (ORCA)
Detector(s):29 or 32 Linear CCD Detectors
Light Source:Plasma torch

Low operating costs
Reliable service life
No-purge UV-PLUS sealed gas purification technology
No external-cooling OPI-AIR interface
Simplified sample introduction
Excellent optical performance

GENESIS ICP-OES Spectrometer