4200-SCS Semiconductor Parameter Analyzer, Keithley Instruments (CAT#: STEM-LE-0107-LC)

The easy-to-use 4200-SCS Semiconductor Characterization System can perform laboratory-level DC and pulse equipment characteristic analysis, real-time drawing, and analysis with high precision and sub-femtoamp resolution. The 4200-SCS provides the most leading features in a fully integrated characteristic analysis system, containing a complete embedded PC with Windows operating system and mass storage capabilities. Its self-documenting, point-and-click interface speeds up and simplifies the data acquisition process, so users can start analyzing their results faster. The additional function makes the pressure measurement function suitable for various reliability tests.

Dimensions (WxDxH): 43.6 x 56.5 x 22.3 cm
Interface: LAN, GPIB, USB, RS-232, parallel port, hard disk, DVD/CD-RW
SMU Range: Up to 210 V (1 A, 20 W or 100 mA, 2 W)
SMU Resolution: 0.1 fA Resolution
CV Measurement Range: fF to nF (from 1 kHz to 10 MHz)
Measurement Resolution: Sub-fA Resolution

Intuitive, point-and-click Windows® environment
Unique Remote PreAmps extends SMU resolution to 0.1fA
C-V instrument makes C-V measurement as easy as DC I-V
Pulse and pulse I-V functions can be used for advanced semiconductor testing
Scope card offers integrated scope and pulse measurement functions
Independent PC offers quick test setup, powerful data analysis, graphics and printing, and on-board mass storage of test results
The unique browser-style Project Navigator organizes tests according to device type, permits access to multiple tests, and offers test sequencing and looping control
Built-in stress/measurement, looping and data analysis for point-and-click reliability testing, including five JEDEC-compliant sample tests
Integrated support for various LCR meters, Keithley switch matrix configuration and Keithley 3400 series and Agilent 81110 pulse generator
Contains software drivers for advanced analysis probes

Integra Series DMM, Data Acquisition, Switching, and Datalogging Systems