Scanning Near-field Optical Microscope alpha300 S, WITec GmbH (CAT#: STEM-LE-2003-LC)

The alpha300 S Scanning Near-field Optical Microscope features a Confocal Microscope (CM), a Scanning Near-Field Optical Microscope (SNOM) and an Atomic Force Microscope (AFM) in a single instrument. By rotating the objective turret, the user can select from among Confocal Microscopy, SNOM or AFM.

Detector(s):PMT, APD
Operating Mode(s):Near-field, Confocal, Atomic Force
Optical Resolution:60 nm @ 532 nm excitation
Wavelength Range:UV-VIS-NIR
Scan Range:100 x 100 x 20 µm^3 Piezo stage (200 x 200 x 20 µm^3 available) 250 mm x 150 mm Mechanical stage available and combinable with piezo stages
Vibration Isolation:Integrated Active Vibration Isolation System