Time-of-Flight Mobility Meter

The system uses Time-of-Flight (TOF) to measure the mobility and related optoelectronic properties of semiconductor materials. The device has the functions of transient photocurrent measurement, electron mobility measurement, hole mobility measurement, two-dimensional plane imaging, and horizontal carrier mobility measurement.

Sample Requirements

• Materials are organic semiconductors; metal-organic frameworks; covalent organic frameworks; perovskite materials; other semiconductor materials.
• Different types of samples have different requirements, please contact the technical teacher for details.

Application

• Transient photocurrent measurement by time-of-flight method
• Electron and hole mobility measurement of semiconductor materials

Instrument and Result Display

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For more information about our time-of-flight mobility meter testing services, please contact us.