SuperSharpSilicon (SSS) Non-Contact AFM Probes, Park Systems Inc (CAT#: STEM-LE-0866-LC)

NANOSENSORS™ SuperSharpSilicon (SSS) AFM tips are designed for non-contact mode or tapping mode AFM. To improve the resolution and micro-roughness of nanostructures, we provide SuperSharpSilicon™ tips with unmatched sharpness.

Type:Non-Contact AFM
Material:Silicon
Resonant Frequency:190 to 330 kHz
Force Constant:42 to 48 N/m
Tip Measurement:3 to 5 µm or 6 to 8 µm
Cantilever Length:115 to 135 µm or 215 to 235 µm

Ensure that the radius of curvature of the tip is <5 nm
The tip has a typical radius of curvature of 2 nm
The typical aspect ratio at 200 nm from the tip is 4:1
Angle of half cone at 200 nm from vertex <10°
Highly doped to eliminate static charge
Chemically inert
High mechanical Q factor enables high sensitivity

PointProbe Plus (PPP) Non-Contact AFM Probes