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Studies of aflatoxins producing Aspergillus flavus in the maize crop by light and scanning electron microscope technology (CAT#: STEM-MIT-0039-LJX)

Introduction

Maize (Zea mays L.) is considered as one of the main cereals, used as a source of food, forage, and processed products. The loss of maize productivity is reported due to effect on roots, stalks, ears, and kernels mainly caused by many fungi. Among these fungal pathogens of maize, Aspergillus flavus (A. flavus) are the most prevalent that produces highly toxigenic aflatoxins that are highly carcinogenic to the consumers.




Principle

Scanning electron microscope (SEM) is another tool to study the surface morphology, which is different from transmission electron microscope and optical microscope. SEM uses extremely narrow electron beams to scan the sample and uses point-by-point imaging to obtain an enlarged image. SEM generates secondary electron emission through the interaction between the electron beam and the sample, and the secondary electron can produce the morphologic image of the sample surface enlargement. SEM can directly utilize the material properties of the sample surface for microscopic imaging.
SEM provides the possibility to study the relationship between the three-dimensional structure of cell or tissue surface and antigen composition. The markers used in scanning electron microscopy should be able to be in the range of scanning electron microscopy, and have good localization ability to cell or tissue antigen. The selection of markers should be based on the purpose of the study. If the volume of the marker cells is large, large markers should be used, while small, easily identifiable markers should be selected to locate the receptor.

Applications

Imaging and analysis in the fields of biology, medicine, materials and chemistry

Procedure

1. Sampling
2. Preparation of slices
3. Staining (Select according to the specific experimental situation)
4. Observation

Materials

• Sample Type:
Maize crop

Notes

Turn off the power when the device is not in use