Photothermal Deflection Spectroscopy (PDS) System

PDS is a non-destructive and highly-sensitive technique that measures the absorbance of semiconducting materials. Its biggest advantage compared to conventional absorption spectroscopy is its high sensitivity which allows detection of sub-bandgap features such as weakly absorbing charge-transfer states in organic semiconductor blends.

Sample Requirements

• The sample is a thin film material.
• Please communicate with the technical teacher about the specific sample delivery situation.

Application

• IV testing
• PDS measurements

Instrument and Result Display

FAQ

Q. What can be characterized by photothermal deflection spectroscopy (PDS)?

A. It can characterize defect states and is widely used in the photovoltaic industry.

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For more information about our photothermal deflection spectroscopy (PDS) system testing services, please contact us.