MiniFlex Benchtop X-ray Diffractometer, Rigaku (CAT#: STEM-LE-1081-LC)

The MiniFlex X-ray diffractometer (XRD) is a multifunctional analytical instrument that can determine: phase identification and quantification, crystallinity percentage (%), crystallite size and strain, lattice parameter refinement, Rietveld refinement And molecular structure.

X-Ray Generator:Cu, Co, Fe, or Cr, 40 kV, 15 mA
Goniometer Type:Vertical, Theta or 2Theta
Detector(s):D/teX, Ultra 1D High speed silicon strip detector
Scanning radius:150 mm

Compact, fail-safe radiation enclosure
Incident beam variable slit
Simple installation and user training
Factory aligned goniometer system
Laptop computer operation
Phase identification
Phase quantification
Percent (%) crystallinity
Crystallite size and strain
Lattice parameter refinement
Rietveld refinement
Molecular structure
8-position autosampler
Graphite monochromator
D/teX Ultra: silicon strip detector
HyPix-400 MF: 2D HPAD detector
Air sensitive sample holder
Travel case

AutoMATE II, SmartSite RS Portable Stress Analyzer, XtaLAB Synergy-DW Versatile Dual Wavelength X-ray Diffractometer with HPC X-ray Detector, XtaLAB Synergy-S Single or Dual Microfocus X-ray Diffractometer