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Magnetic AFM Probes, HQ:NSC18/Co-Cr/Al BS, 75 kHz (2.8 N/m), MikroMasch (CAT#: STEM-M-0096-LKN)
Cat Number: STEM-M-0096-LKN
Application: Cantilevers of the 18 series are optimal for Lift mode operation AFM as they provide high stability in tapping mode as well as high sensitivity to magnetic and electric forces that may be weak. These cantilevers are also used for mapping of materials properties in force modulation mode and true topography imaging of the soft samples.
Model: HQ:NSC18/Co-Cr/Al BS
Description
MikroMasch Magnetic AFM Probes are used for mapping of magnetic stray field distribution over the surface of a sample in MFM. The probe is sharp enough to image magnetic domains on surface.
Specification
Typical radius of uncoated tip: 8 nm
Resulting tip radius with the coating: < 30 nm
Full tip cone angle: 40°
Total tip height: 12 - 18 µm
Probe material: n-type silicon
Tip coating: Platinum
Detector coating: Platinum
Resulting tip radius with the coating: < 30 nm
Full tip cone angle: 40°
Total tip height: 12 - 18 µm
Probe material: n-type silicon
Tip coating: Platinum
Detector coating: Platinum
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Wide range of applications
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