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General Purpose AFM Probes, HQ:NSC19/No Al, 65 kHz (0.5 N/m), MikroMasch (CAT#: STEM-M-0087-LKN)
Cat Number: STEM-M-0087-LKN
Application: Cantilevers of the 19 series combine high resonance frequency and low spring constant, which makes them applicable to imaging soft and fragile surfaces at a relatively high speed in tapping mode. They are compatible with Bruker ScanAsyst ® PeakForce Tapping™*. The cantilevers may also be useful in LFM due to their high sensitivity to the lateral forces.
Model: HQ:NSC19/No Al
Description
MikroMasch General Purpose AFM Probes are suitable for most of the routine topography imaging experiments. Using these probes, lateral resolution down to 5 nm is attainable for scan size below 1 μm. Usually, sharpened silicon etched probes are used for general purpose measurements.
Specification
Typical radius of uncoated tip: 8 nm
Full tip cone angle: 40°
Total tip height: 12 - 18 µm
Probe material: n-type silicon
Probe bulk resistivity: 0.01 - 0.025 Ohm*cm
Full tip cone angle: 40°
Total tip height: 12 - 18 µm
Probe material: n-type silicon
Probe bulk resistivity: 0.01 - 0.025 Ohm*cm
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Wide range of applications
For various laboratory needs
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