Atomic Force Microscope BK-AFM1000 Contact and Lapping Mode (CAT#: STEM-LT-0938-ZJF)

The BK-AFM1000 Atomic Force Microscope provides nanometer-level resolution for the analysis of surface morphology, roughness, and material properties. It supports multiple working modes including contact and lapping modes, with optional modes for phase, friction, magnetic, and electrostatic measurements. Equipped with high-precision scanners, advanced feedback control, and an optical observation system, the BK-AFM1000 delivers accurate and detailed topographic maps, making it ideal for both academic research and industrial applications.

Working Modes: Contact mode, lapping mode; optional modes: Phase, Friction (LFM), Magnetic (MFM), Electrostatic (EFM)
Sample Size: Diameter ≤ 90 mm, Height ≤ 20 mm
Scanners Available: 10 × 10 μm, 20 × 20 μm, 50 × 50 μm, 100 × 100 μm
Scanning Resolution: 0.2 nm (XY direction), 0.05 nm (Z direction)
Range of Sample Movement: ±6.5 mm
Step-Motor Pulse Width: 10 ± 2 ms
Image Sampling Points: 512 × 512
Optical Magnification: 4×
Optical Resolution: 2.5 μm
Scan Rate: 0.6 Hz – 4.34 Hz
Scan Angle: 0° – 360°
Scanning Control: 18-bit D/A in XY direction, 16-bit D/A in Z direction
Data Sampling: 14-bit A/D, dual 16-bit A/D multi-channel synchronous sampling
Feedback: DSP digital feedback
Feedback Sampling Rate: 64 kHz
Computer Interface: USB 2.0
Operating System: Windows XP/7/8/10
Power Supply: AC 220 V, 50/60 Hz; optional AC 110 V, 50/60 Hz
Package Size (W×D×H): 550 × 550 × 1150 mm
Gross Weight: 65 kg

Integrated scanning-probe and sample-stage enhance the anti-interference capability of the spring suspension system.
Precision laser and probe positioning device simplify probe changing and spot adjustments.
Auto-approaching sample-to-probe mechanism efficiently prevents cantilever crashes.
Vertical sample probe approach ensures precise positioning of the area of interest.
High-precision, wide-range XY table allows for flexible selection of sample scanning areas.
Top-view CCD system provides real-time observation and precise probe positioning on the selected sample region.
Modular electronic control system design simplifies maintenance and enables continuous improvements.
The compact Model 2000 is easily transportable in an aluminum case.
The hermetic box in Model 1000 ensures a controlled environment for samples.

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