X-Ray Fluorescence Spectrometer, Model DW-EDX3000, DRAWELL (CAT#: STEM-S-0038-CJ)

DW-EDX3000 uses X-ray beam from X-ray tube to irradiate the sample, and the element atoms will be excited and emit the secondary X-ray fluorescence characteristic for its own energy. Then these elements get identified and its content measured.

Measurement precision:0.05%(≥96%)
Analysis range:1ppm-99.99%
Analytical range of elements:More than 60 elements from potassium (K) to uranium (U)
Measuring object:powder, solid and liquid
Measurement time:(60~300)s
Ambient temperature range:(15-30)t
Relative humidity:W70%
Weight:30kg
Working voltage:AC 110V/220V
Configuration:Single sample chamber; Si PIN semiconductor detector
; Amplifier circuit; High and low voltage power supplies; X-ray tube; Non-vacuum chamber

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Handheld X-Ray Fluorescence Spectrometer (XRF) Analyzer, Model TrueX-500(Si-Pin), DRAWELL (CAT#: STEM-S-0041-CJ)
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